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Highly Accelerated Life Test Chamber(HALT Chamber)

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Highly Accelerated Life Test Chamber(HALT Chamber)

Description

This test chamber is suitable for life test research on electrical and electronic components, printed circuit board assemblies, etc. By applying single or comprehensive stresses including high-temperature step, low-temperature step, rapid temperature change cycle, six-degree-of-freedom non-Gaussian broadband random vibration, etc., and gradually increasing the stress on these test samples, the stress limit they can withstand is determined. This helps to quickly identify product defects and make improvements in the R&D, design, trial production, and mass production stages, shorten the R&D time, and achieve the goal of rapid market launch while ensuring product quality.

Prooduct Name Highly Accelerated Life Test Chamber(HALT Chamber)
Prooduct Model HALT101-GT900 HALT102-GT1200
Working chamber volume 1.1/1.5m3 1.8/2.3m3
Working chamber dimensions
(mm)
W 1070 1370
H 970/1270 970/1270
D 1070 1370
External dimensions
(mm)
W 1780 2100
H 3064 3064
D 1400 1700
Temperature range -100~+200℃
Temperature fluctuation ≤±1℃(Stabilization time within 2 minutes)
Temperature control accuracy ±1℃
Heating/Cooling Rate ≥70℃/min
Vibration Three-axis six degrees of freedom
Vibration platform(mm) 910×910(W×D) 1213×1213(W×D)
Acceleration value 1~75Grms,Adjustable
Vibration frequency 2~10000Hz;5~4000Hz(90% energy zone)